Lab’s paper ACCEPTED @ DSN-47 2017

“RT Level vs. Microarchitecture Level Reliability Assessment: Case Study on ARM Cortex-A9 CPU”, A.Chatzidimitriou, M.Kaliorakis, D.Gizopoulos, M.Iacaruso, M.Pipponzi, R.Mariani, S.Di Carlo, IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2017), Denver, CO, USA, June 2017.